Chemical Vapor Deposition (CVD) System for Carbon Nanotubes Synthesis (MTI Corporation): The system is used for the synthesis of carbon nanotubes under different conditions of temperature, pressure, and gas flow rate.

Physical Property Measurement System (PPMS) (Quantum Design): The PPMS system is used to measure the electrical and magnetic properties of materials in large range of temperatures (as low as 2 K) and magnetic fields (as high as 7 Tesla) in a very accurate manner.

Coating Unit (Leybold): This system is used for thermal evaporation of solid materials such as metals and semiconductors, elements and compounds.

Thermal and Sputtering Unit (Torr): This system is used for thermal and sputtering deposition of metals (DC Sputtering) and semiconductors and Insulators (RF Sputtering.

Capacitance-Voltage System (Keithley): This system is used for measurements of Capacitance as function of applied bias voltage as well as function of time. There are two possibilities in this system, measurements at 100 kHz and 1 MHz and quasistatic measurements. It is mostly used for electronic devices such as diodes and transistors where there are junctions.

Current-Voltage Systems (Keithley): There are two types of this system Keithley 236 (Imax = 0.1 A) and Keithley 238 (Imax = 1 A). The only difference between the two systems is the current limit. This system is used to measure the variation of current with voltage and vice-versa.

Impedance Spectroscopy (Solartron): This system is used to measure the dielectric properties of materials. Real and Imaginary parts of the impedance and the related physical quantities such as the dielectric constant and the AC conductivity of the devices can be obtained.

UV/VIS/NIR Spectrophotometer (Jasco): This system is used to measure the optical properties of materials (films, liquids and powders).